By F. W. Young Jr., T. O. Baldwin, A. E. Merlini, F. A. Sherrill (auth.), Gavin R. Mallett, Marie J. Fay, William M. Mueller (eds.)
The papers offered during this quantity of Advances in X-Ray research have been selected from these awarded on the Fourteenth Annual convention at the functions of X-Ray research. This convention, subsidized by way of the Metallurgy department of the Denver examine Institute, college of Denver, used to be hung on August 24,25, and 26, 1965, on the Albany lodge in Denver, Colorado. Of the fifty six papers offered on the convention, forty six are incorporated during this quantity; additionally integrated is an open dialogue hung on the results of chemical com bination on X-ray spectra. the themes provided signify a extensive scope of purposes of X-rays to a number of fields and disciplines. those integrated such fields as electron-probe microanalysis, the impact of chemical mixture on X-ray spectra, and the makes use of of soppy and ultrasoft X-rays in emission research. additionally integrated have been classes on X-ray diffraction and fluor escence research. there have been a number of papers on targeted themes, together with X-ray topography and X-ray absorption fine-structure research. William L. Baun contributed huge attempt towards the convention by way of organizing the consultation at the impact of chemical mix on X-ray spectra superb constitution. a different consultation used to be verified during the first-class efforts of S. P. Ong at the makes use of and applica tions of sentimental X-rays in fluorescent research. we provide our honest due to those males, for those specific periods contributed vastly to the luck of the conference.
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Extra resources for Advances in X-Ray Analysis: Volume 9 Proceedings of the Fourteenth Annual Conference on Applications of X-Ray Analysis Held August 25–27, 1965
In these figures black lines represent absorption lines and white lines represent diffraction lines, for the photographed patterns are positive. Figure 3 shows the pseudo-Kossel patterns of specimen no. 1 at various stages of deformation. Through crystallographic studies it was found that the (II1) line and the (111) line in Figure 3 correspond to the primary slip plane and critical slip plane of the specimen, respectively. It is conceived that in the deformation stages shown in Figure 3 only the primary slip plane is active in the specimen at the earlier stage of deformation.
Forest, Richard J. Barton, and N. C. --------j Figure 3. EJlipse formed by intersection of plane containing the incident and diffracted X-ray beams with the film cylinder. B R c~-----=,o R Figure 4. Circle formed by intersection of a plane normal to the film cylinder axis with the film cylinder. where CA = R. R,sin-1 (AO) 2·R (2) Equations (1) and (2) were evaluated on a computer, a table of x and y for a given set of values of y and 8 was determined, and the resulting net drawn. A 5° interval net is illustrated in Figure 5; we also have data for 1° and 2° nets.
However, the diffusion-induced slip was still present. A topograph of another diffused Ga(As, P) film (24% phosphorus) also showed irregular intensity variations, a loss of 4% phosphorus (after diffusion) was also determined. The structural uniformity of the magnesium-diffused GaAs slice suggests that the heat treatment has a negligible effect on the diffused Ga(As, P). The anomalous surface image is probably the result of an intensive strain field; dislocation slip relieved the nonuniformly distributed stress.